
DS1558
5 of 18
Table 1. OPERATING MODES
V
CC
CE OE WE
DQ0–DQ7 MODE POWER
V
IH
X X High-Z Deselect Standby
V
IL
XV
IL
D
IN
Write Active
V
IL
V
IL
V
IH
D
OUT
Read Active
V
CC
> V
PF
V
IL
V
IH
V
IH
High-Z Read Active
V
SO
< V
CC
< V
PF
X X X High-Z Deselect CMOS Standby
V
CC
< V
SO
< V
PF
X X X High-Z Data Retention Battery Current
DATA READ MODE
The DS1558 is in the read mode whenever CE is low and WE is high. The device architecture allows
ripple-through access to any valid address location. Valid data is available at the DQ pins within t
AA
after
the last address input is stable, provided that
CE and OE access times are satisfied. If CE or OE access
times are not met, valid data is available at the latter of chip-enable access (t
CEA
) or at output-enable
access time (t
OEA
). The state of the data input/output pins (DQ) is controlled by CE and OE . If the
outputs are activated before t
AA
, the data lines are driven to an intermediate state until t
AA
. If the address
inputs are changed while CE and OE remain valid, output data remains valid for output-data hold time
(tOH), but then goes indeterminate until the next address access.
DATA WRITE MODE
The DS1558 is in the write mode whenever WE and CE are in their active state. The start of a write is
referenced to the latter occurring transition of WE or CE . The addresses must be held valid throughout
the cycle. CE and WE must return inactive for a minimum of t
WR
prior to the initiation of a subsequent
read or write cycle. Data in must be valid t
DS
prior to the end of the write and remain valid for t
DH
afterward. In a typical application, the OE signal is high during a write cycle. However, OE can be active
provided that care is taken with the data bus to avoid bus contention. If OE is low prior to WE
transitioning low, the data bus can become active with read data defined by the address inputs. A low
transition on WE then disables the outputs t
WEZ
after WE goes active.
DATA RETENTION MODE
The 5V device is fully accessible and data can be written and read only when V
CC
is greater than V
PF
.
However, when V
CC
is below the power-fail point V
PF
(point at which write protection occurs), the
internal clock registers and SRAM are blocked from any access. When V
CC
falls below the battery switch
point V
SO
(battery supply level), device power is switched from the V
CC
pin to the backup battery. RTC
operation and SRAM data are maintained from the battery until V
CC
is returned to nominal levels.
The 3.3V device is fully accessible and data can be written and read only when V
CC
is greater than V
PF
.
When V
CC
falls below V
PF
, access to the device is inhibited. If V
PF
is less than V
SO
, the device power is
switched from V
CC
to the internal backup lithium battery when V
CC
drops below V
PF
. If V
PF
is greater
than V
SO
, the device power is switched from V
CC
to the internal backup lithium battery when V
CC
drops
below V
SO
. RTC operation and SRAM data are maintained from the battery until V
CC
is returned to
nominal levels.
All control, data, and address signals must be powered down when V
CC
is powered down.
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