Rainbow-electronics AT77C104B Uživatelský manuál stáhnout pdf (Strana 3)

AT77C104B

5347B–BIOM–08/04

Figure 1. Typical Application

The pull-up must be implemented for the master controller. The noise should be lower

than 30 mV peak to peak on VDDA.

Figure 2. Pin Description

The TESTA pin is only used for testing and debugging. The SCANEN pin is not used in

the final application and must be connected to ground.

Warning : SSS and FSS must never be low at the same time. When both SSS and FSS

equal 0, the chip switches to scan test mode. With the SPI protocol, this

configuration is not possible as only one slave at a time can be selected.

However, this configuration works when debugging the system.

TESTA

IRQ TPP

MISO VDDD

MOSI

SCK GNDD

SSS VDDA

FSS

SCANEN GNDA

FPL

RST

VDDA

10 kΩ

VDDD VDDD

10µF

GND

10µ

GND

VDDD

GNDD

GNDA

VDDD

VDDA

SCK

TESTA

MOSI

TPP

MISO

SCANEN

SSS

IRQ

FSS

RST

FPL

1 2 3 4 5 6 7 8 ... 35 36

Features 1
Description 1
Applications 1
AT77C104B 10
AT77C104B 11
Regional Headquarters 36

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